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Flying Probe Testing

Agility and Flexibility in Testing

Seica Flying Probe Testing at Analog Technologies Corp

A Flying Probe utilizes robotic electrical probes to swiftly and accurately test circuitry, eliminating the need for costly custom fixtures (i.e. bed of nails).

These probes can precisely measure electrical characteristics, detect defects, and verify connectivity to test circuit functionality.

Specification Highlights:


  • 8 test heads

  • Minimum pad width of 2 mil (50 μm)

  • Minimum pad pitch of 6 mil (150 μm)

  • Wide range of PCB sizes, shapes, and thicknesses supported

  • Multiple test methods supported including Analog Drivers (Current/Voltage – AC/DC source), DMM, Active/Passive Guarding, Frequency Net Testing (FNODE), Digital Channels (Functional / Boundry Scan), Reverse Engineering, and on-board programming capable

  • Fully traceable test records and customizable test reporting

Contact ATC for help with your testing challenges!

Watch The Seica Pilot Flying Probe in Action

Why Choose Us?

Long-term customer relationships

Broad base of engineering and manufacturing expertise

Collaborative, flexible and solutions oriented

Located minutes from Minneapolis St. Paul International Airport

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